The VPT Rad radiation laboratory is a one-stop shop for integrated electronic component testing solutions. Our services include test program planning, test execution, results evaluation, and full reporting. We coordinate irradiation scheduling and optimize the test plan development and test performance to efficiently and effectively meet customer requirements.
Turn-Key Test Solutions
VPT Rad offers expedited solutions for radiation hardness assurance (RHA) and radiation tolerance testing for a wide variety of electronic components, including diodes, MOSFETs, linear regulators, oscillators and more. With our in-house equipment and extensive expertise, our customers find our turn-key test solutions
to be accurate, efficient and convenient.
Below is an abbreviated list showing the part numbers which are currently available
for VPT Rad turn-key testing:
|Product Category||Part Type||Part Number||Packages||In-House Test Equipment|
|Discrete||BJT||JANXX2NXX||All package types||TESEC 881|
|Discrete||MOSFET||JANXX2NXX||All package types||TESEC 881|
|IC||Linear Regulator||HS-117||All package types||Custom|
|IC||OP Amp||OP27||All package types||Custom|
|IC||ADC||AD574||All package types||Custom|
|IC||Sensors||AD590||All package types||Custom|
|IC||Oscillator||MCM2767-36M||All package types||Custom|
*This is a partial preview only. Please contact us to learn if our expedited testing services are available for your products.
Test Engineering Solutions
As a turn-key provider of test solutions, VPT Rad also provides the design and fabrication of test hardware, and the design and development of software for data acquisition.
VPT Rad and its associated entities have been providing test solutions to the Hi-REL component suppliers since 2008. We offer clients a one-stop shop, including integrated test development solutions such as the following:
- Software for data management/data parsing and auto-reporting
- Printed Circuit Board design and fabrication
- Automated test equipment (ATE) for data acquisition
TESEC 881-TT Discrete Test System Specializing in:
- Discrete component test systems for incoming inspection
- Sampling of small signal/high power transistors, diodes, FETs, zeners, IGBTs, SCRs, and triacs (test for most hi-rel test parameters)
- 1000 VDC / 75 A capabilities
LTX Credence D10 Mix Signal Test System Specializing in:
- Memory ICs
- Linear Regulators