The Impact of TID (Total Ionizing Dose) Radiation Performance on Subjected COTS Devices
Chelmsford, MA, August 8, 2024 —VPT Rad carried out a radiation test to characterize performance changes in the Devices Under Test (DUT) due to the effects of Total Ionizing Dose (TID). The goal was to evaluate how the subjected devices perform once exposed to Cobalt-60 gamma photons at various increasing levels of exposure.
Summary of the PASS/FAIL results
Note: Orange Indicates KTL Specifications Failure; Red Indicates Device Specifications Failure.
Total Ionizing Dose Results Overview
Samples were electrically characterized after exposure to specified levels. All tests were performed in conformance with the conditions and requirements described by MIL-STD-750/883 Test Method 1019. VPT Rad used it's DLA Laboratory Suitability for this test method. The Devices Under Test (DUT) suffered functional failures post 10krad; no further tests were performed. For complete test results, contact VPT Rad to learn more about the testing they perform on COTS electronics.
